ion 的問題，透過圖書和論文來找解法和答案更準確安心。 我們找到下列訂位、菜單、價格優惠和問答集

Microanalysis of Atmospheric Particles: Techniques and Applications in Climate Change and Air Quality

為了解決ion 的問題，作者Conny, Joseph M. 這樣論述：

The effects of atmospheric aerosols on climate and air quality are very timely. Due to advances in instrumentation as well as the need to study the complexity of atmospheric interactions, aerosol analysis has progressed from primarily the analysis of bulk material to the analysis of individual pa

rticles. Microanalysis of Atmospheric Particles: Climate Change and Air Quality - presents the latest developments in the various techniques for particles captured in place and how those techniques are used to explain the complexity of aerosols and their effects on climate and air quality. Technique

s involve scanning electron microscopy, computer-controlled SEM for particle population analysis, transmission electron microscopy, and scanning TEM, energy dispersive x-ray spectrometry associated with electron microscopy, energy-filtering and electron energy loss spectrometry associated with TEM,

focused ion-beam scanning electron microscopy and FIB tomography, micro-Raman spectroscopy, scanning transmission x-ray microscopy and near-edge x-ray absorption fine structure, and atomic force microscopy.Volume highlights include: - Presents the state-of-the art in analyzing individual atmospheric

particles by a variety of microanalytical techniques- Focuses on aerosols in ambient air and their climate or air quality impacts or whose precursor emissions directly impact climate and air quality- Discusses the use of microanalysis in studies of soot, mineral dust, organic aerosols, bioaerosols,

heterogeneous reactions and particle aging, ice nucleation, and particle hygroscopicityMicroanalysis of Atmospheric Particles: Climate Change and Air Quality is a valuable resource for graduate students, researchers and professionals in the fields of atmospheric sciences, geosciences, earth science

s, environmental sciences, mineralogy, electron microscopy, and climate change studies.

ion 進入發燒排行的影片

In Situ Transmission Electron Microscopy: Experimental Design and Practice

為了解決ion 的問題，作者Hattar, Khalid,Sharma, Renu 這樣論述：

Dr. Khalid Hattar is a Principal Member of the Technical Staff in the Ion Beam Lab and Center for Integrated Nanotechnologies at Sandia National Laboratories in Albuquerque, New Mexico. He received a B.S. in Chemical Engineering with an emphasis in Materials Science from University of California, Sa

nta Barbara in 2003, and a Ph.D. in Materials Science and Engineering from University of Illinois, Urbana-Champaign in 2009 under the guidance of Professor Ian M. Robertson. He specializes in determining the property-microstructure relationship for a variety of structural and functional materials th

rough in situ electron microscopy techniques in various extreme environments, as well as tailoring local properties of materials through ion beam modification. This includes the development of the In-situ Ion Irradiation Transmission Electron Microscope that is designed to explore a range of juxtapo

sed conditions. He has given 74 invited presentations, published three book chapters, and over 100 research articles. Dr. Renu Sharma is a Project Leader in the Physical Measurement Laboratory at National Institute of Standards and Technology (NIST). She received a B.S. and B.Ed. in Physics and Chem

istry from Panjab University, India, and M.S. and Ph.D. degrees in Solid State Chemistry from the University of Stockholm, Sweden. She joined NIST in 2009 as a Faculty Research Associate in the Department of Chemistry and Biochemistry and the Center for Solid State Science. She is a pioneer in the d

evelopment of environmental scanning transmission electron microscopy (E(S)TEM), combining atomic-scale dynamic imaging with chemical analysis to probe gas-solid reactions. She has received a Bronze Medal of Service from Department of Commerce for developing new measurement techniques. She has given

over 90 invited presentations, edited one book, published 5 book chapters and over 200 research articles. At the NIST, she established an advanced E(S)TEM measurement capabilities, that combines Raman spectroscopy, cathodoluminescence with electron diffraction, electron spectroscopy, high-resolutio

n imaging and plasmonics, applied in nanoscience research.

考慮非完全游離針對隨機參雜之電晶體之電流電壓 變異性分析

為了解決ion 的問題，作者曾郁鈞 這樣論述：

根據摩爾定律的延續，電晶體在晶片裡的密度每 兩年即倍增，也因此提升工作時的表現和降低能量的消 耗。而電晶體運作時的電流機制是建立在假設電位和雜質濃度是連續的情況下的飄移 擴散模型。當電晶體隨著科技的進步發展至奈米等級的結構時，許多可靠度的問題 隨機參雜 會因此被放大，甚至破壞 原本漂移 擴散模型的假設。因此在探討這方面的問題前，我們必須要對隨機參雜的雜質做深入的探討，並且發展一個物理模型來解決 此 問題。然而，典型的物理模型卻只能考慮數量對電晶體造成的影響，而無法將雜質位置對電晶體的影響正確地考慮進去。除此之外，在典型的元件模擬中，雜質的游離率都 假設 為 100% 。但實際上在高雜質濃度

的條件下是不符合的。在高雜質濃度的條件下亦會產生能隙縮減的量子效應，進而影響了電晶體的表現。因此，為了要得到更準確的模擬結果，同時考慮這兩項因素是必須的(非完全游離&能隙縮減模型)。然而，此模型是一束縛態問題，而飄移-擴散模型是非束縛態的問題，因此不容易在典型的飄移擴散模型上考慮此模型。在此論文中，我們設計了一套新的方法，可以在飄移-擴散模型的前提下考慮隨機參雜(雜質數目、雜質位置)的影響，且同時計算出雜質的游離率和能隙縮減的量。接著利用蒙地卡羅方法探討在平面電晶體的電流電壓的變異性。